Facility at APE

These chambers are connected to two end-stations (LE & HE) of APE beamline with UHV transfer systems in order to prepare samples and characterize them before and/or after the electron spectroscopy with synchrotron light. The sample preparation chamber is equipped with an ion gun, heating stages, evaporators (PVD), a thickness monitor,  LEED (Low Energy Electron Diffraction) and AES (Auger Electron Spectroscopy) system, and Kerr magnetometers. It enable users to clean single crystals, grow thin epitaxial films and measure the long range order of the surface structure, surface composition and magnetic property.

Our atomic resolution STM (Scanning Tunneling Microscope) is a powerful tool to measure real space surface structures, with and without long range order, immediately after the sample preparation. It is also used for quantitative analysis of film thickness in submonolayer range grown in the preparation chamber.

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Technical specifications

Base pressure < 1 x 10 -10 mbar
3 heating stages HT (RT- 2000K), WT (170K - 900K), LT (RT - 700K)
Ion gun (SPECS IQE11/35)
3 evaporator ports (CF40)
Gas inlet valve (variable leak valve)
LEED+AES (Omicron SPECTALEED)
3 Kerr magnetometers Transversal (Hmax=600 Oe), Polar (Hmax=3000 Oe), 3D (Hmax=80 Oe)
STM (room temperature, ETH-Z built))
Out of plane (a) and in plane (b) magnetic hysteresis curves for Fe films grown on O/Cu(332), measured with Magnetic Optical Kerr Effect. (C.V. Barbosa et al, New J. Phys. 11 2009 113046)

Out of plane (a) and in plane (b) magnetic hysteresis curves for Fe films grown on O/Cu(332), measured with Magnetic Optical Kerr Effect. (C.V. Barbosa et al, New J. Phys. 11 2009 113046)

The map of techniques

at MM building at Q2 building at Elettra experimental hall at CNR-IOM cloud at Fermi-T-Rex laboratory Surface & Nano Science Lab, STM/STS PLD XPS & ambient pressure XAS ARPES & Spin ARPES MOKE & Masked deposition system XPS MBE Oxides SPRINT laboratory SEM XRD PVD data repository open data data analysis
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Scientists in charge